发明名称 METHOD FOR TUNABLY REPAIRING LOW-K DIELECTRIC DAMAGE
摘要 A method for providing a tuned repair for damage to a silicon based low-k dielectric layer with organic compounds, where damage replaces a methyl attached to silicon with a hydroxyl attached to silicon is provided. A precursor gas is provided, comprising a first repair agent represented as Si—(R)x(OR′)y, where y≧1 and x+y=4, and wherein R is an alkyl or aryl group and R′ is an alkyl or aryl group and a second repair agent represented as Si—(R)x(OR′)yR″, where y≧1 and x+y=3, and wherein R is an alkyl or aryl group and R′ is an alkyl or aryl group, and R″ is of a group that reduces interfacial surface tension between a wet clean chemical and the low-k dielectric. Some of the first repair agent and second repair agent are bonded to the low-k dielectric to form a monolayer of the first repair agent and the second repair agent.
申请公布号 US2011097821(A1) 申请公布日期 2011.04.28
申请号 US20090604222 申请日期 2009.10.22
申请人 LAM RESEARCH CORPORATION 发明人 SIRARD STEPHEN M.;DEYOUNG JAMES;TURMEL ODETTE
分类号 H01L21/30 主分类号 H01L21/30
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