摘要 |
An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray source 10 creating an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed angle 2&thetas; for high energy energy dispersive XRD For XRF, an X-ray detection system is used
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