发明名称 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, NOVEL COMPOUND, AND ACID GENERATOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a novel compound useful as an acid generator for resist composition, the acid generator formed of the compound, the resist composition containing the acid generator, and a method for forming a resist pattern using the resist composition. <P>SOLUTION: The resist composition contains a base component (A) whose solubility to an alkali developer changes by the action of an acid, and an acid generator component (B) which generates the acid by exposure. The acid generator component (B) contains an acid generator (B1) formed of a compound having a group represented by general formula (I) in a cation part, wherein R<SP>5</SP>represents an organic group having a carbonyl group, an ester bond or a sulfonyl group, and Q represents a divalent linking group. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011085878(A) 申请公布日期 2011.04.28
申请号 JP20090270085 申请日期 2009.11.27
申请人 TOKYO OHKA KOGYO CO LTD 发明人 KAWAKAMI AKINARI;UTSUMI YOSHIYUKI;HANEDA HIDEO;SESHIMO TAKEHIRO;MATSUZAWA KENSUKE;ISHIZUKA KEITA;ENDO KOTARO
分类号 G03F7/004;C07C309/06;C07C381/12;C08F20/10;G03F7/039;H01L21/027 主分类号 G03F7/004
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