发明名称 METHOD OF FABRICATING CMOS TRANSISTOR
摘要 A method of fabricating a CMOS transistor includes forming strained channels by re-crystallized amorphous polysilicon with the tensile film or the compressive film during annealing. C or Ge ions are optionally used to form solid-phase epitaxy to amplify the stress in the strained channel. Therefore, the charge carrier mobility in a CMOS transistor is improved.
申请公布号 US2011097859(A1) 申请公布日期 2011.04.28
申请号 US20090605377 申请日期 2009.10.26
申请人 CHIANG WEN-TAI;TSAI CHEN-HUA;TSAI CHENG-TZUNG;LIU PO-WEI 发明人 CHIANG WEN-TAI;TSAI CHEN-HUA;TSAI CHENG-TZUNG;LIU PO-WEI
分类号 H01L21/8238 主分类号 H01L21/8238
代理机构 代理人
主权项
地址
您可能感兴趣的专利