发明名称 FREQUENCY CHARACTERISTIC MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To highly precisely measure the frequency characteristics of an object to be measured. SOLUTION: A frequency characteristic measurement device 100 measures frequency characteristics of an object 200 to be measured. The object 200 is, for example, an equalizer or an acoustic space. A signal creation section 12 creates a reference signal SREF in which an amplitude spectrum QA linearly continues along a frequency axis. An output section 14 outputs the reference signal SREF to the object 200. A detection section 22 detects a measurement signal SDET by adding the frequency characteristic of the object 200 to the reference signal SREF. A signal analysis section 24 analyzes frequency characteristics F of the object 200 by analysis of the measurement signal SDET. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011085691(A) 申请公布日期 2011.04.28
申请号 JP20090237270 申请日期 2009.10.14
申请人 YAMAHA CORP 发明人 KOMURA HAJIME;OKAZAKI MASATSUGU
分类号 G10K15/00;G01R23/16 主分类号 G10K15/00
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