| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray inspection device which automatically and properly sets various parameters by simple operation without setting various parameters for image processing by a user and simplifies setting work before inspection. SOLUTION: The X-ray perspective image of a normal inspection target is captured and a parameter for detecting an inspection region is automatically set from the X-ray perspective image. After a binarized threshold value used for extracting an article image is temporarily determined from the X-ray perspective image, the threshold value for extracting the article image is rationalized to be automatically set and the X-ray perspective image of the normal inspection target is only captured before inspection to dispense with the setting work of the parameter for detecting the inspection region and the threshold value for extracting the article image. COPYRIGHT: (C)2011,JPO&INPIT
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