发明名称 Detection Apparatus for Detecting Charged Particles, Methods for Detecting Charged Particles and Mass Spectrometer
摘要 Embodiments of the invention provide a detection apparatus for detecting charged particles having a secondary particle generator for generating secondary charged particles in response to receiving incoming charged particles, a charged particle detector for receiving and detecting secondary charged particles generated by the secondary particle generator, a photon generator for generating photons in response to receiving secondary charged particles generated by the secondary particle generator, and a photon detector for detecting the photons generated by the photon generator.
申请公布号 US2011095177(A1) 申请公布日期 2011.04.28
申请号 US20100909507 申请日期 2010.10.21
申请人 发明人 GIANNAKOPULOS ANASTASSIOS;MAKAROV ALEXANDER A.
分类号 H01J49/00 主分类号 H01J49/00
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