发明名称 ELECTRIC PROPERTY TESTER FOR FPD SUBSTRATE HAVING FUNCTION PREVENTING DAMAGE FROM STATIC ELECTRICITY
摘要 PURPOSE: An electric property tester for an FPD substrate having a function preventing damage from static electricity is provided to remove static electricity of low voltage remaining on the surface of the FPD substrate. CONSTITUTION: In an electric property tester for an FPD substrate having a function preventing damage from static electricity, an electrical property test(200) having an SMU terminal connected to a signal transmission cable. A probe station(100) including a probe pin and a probe card assembly. A first relay which is contacted to the probe pin is connected to the signal transmission cable. A discharge circuit discharge static electricity which is induced in a substrate when the probe pin is contacted to the substrate.
申请公布号 KR20110042760(A) 申请公布日期 2011.04.27
申请号 KR20090099575 申请日期 2009.10.20
申请人 YANG ELECTRONIC SYSTEMS CO., LTD. 发明人 KIM, JONG MOON;CHO, WON IL;LEE, WON KYU
分类号 G01R1/073;G02F1/13 主分类号 G01R1/073
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