发明名称 |
ELECTRIC PROPERTY TESTER FOR FPD SUBSTRATE HAVING FUNCTION PREVENTING DAMAGE FROM STATIC ELECTRICITY |
摘要 |
PURPOSE: An electric property tester for an FPD substrate having a function preventing damage from static electricity is provided to remove static electricity of low voltage remaining on the surface of the FPD substrate. CONSTITUTION: In an electric property tester for an FPD substrate having a function preventing damage from static electricity, an electrical property test(200) having an SMU terminal connected to a signal transmission cable. A probe station(100) including a probe pin and a probe card assembly. A first relay which is contacted to the probe pin is connected to the signal transmission cable. A discharge circuit discharge static electricity which is induced in a substrate when the probe pin is contacted to the substrate. |
申请公布号 |
KR20110042760(A) |
申请公布日期 |
2011.04.27 |
申请号 |
KR20090099575 |
申请日期 |
2009.10.20 |
申请人 |
YANG ELECTRONIC SYSTEMS CO., LTD. |
发明人 |
KIM, JONG MOON;CHO, WON IL;LEE, WON KYU |
分类号 |
G01R1/073;G02F1/13 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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