发明名称 QUANTUM EFFICIENCY MEASURING DEVICE AND QUANTUM EFFICIENCY MEASURING METHOD
摘要 A sample (OBJ1) that is an object whose quantum efficiency is to be measured, and a standard object (REF1) having a known reflectance characteristic are each attached to a sample window (2) provided in a plane mirror (5). Based on respective spectrums measured by a spectrometer in respective cases where the sample (OBJ1) is attached and the standard object (REF1) is attached, the quantum efficiency of the sample (OBJ1) is measured. The plane of an opening of an observation window (3) is made substantially coincident with the exposed surface of the sample (OBJ1) or standard object (REF1), so that direct incidence, on the observation window (3), of the fluorescence generated from the sample (OBJ1) receiving an excitation light (L1) and the excitation light (L1) reflected from sample (OBJ1) is prevented.
申请公布号 EP2315003(A1) 申请公布日期 2011.04.27
申请号 EP20090709437 申请日期 2009.01.20
申请人 OTSUKA ELECTRONICS CO., LTD. 发明人 OHKUBO, KAZUAKI
分类号 G01N21/64 主分类号 G01N21/64
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