发明名称 Heterojunction Bipolar Transistor
摘要 A heterostructure bipolar transistor, HBT, includes shallow trench isolation, STI, structures 6 around a buried collector drift region 8 in contact with a buried collector. A gate stack 10 including a gate oxide 12 and a gate 14 is deposited and etched to define a base window 20 over the buried collector drift region 8 and overlapping the STI structures 6. The etching process is continued to selectively etch the buried collector drift region 8between the STI structures 6 to form a base well 22. SiGeC may be selectively deposited to form epitaxial silicon-germanium 26 in the base well in contact with the buried collector drift region 8 and poly silicon-germanium 28 on the side walls of the base well and base window. Spacers 32 are then formed as well as an emitter 34.
申请公布号 EP2315238(A1) 申请公布日期 2011.04.27
申请号 EP20090174032 申请日期 2009.10.26
申请人 NXP B.V. 发明人 DONKERS, JOHANNES JOSEPHUS THEODORUS MARINUS;MERTENS, HANS;VANHOUCKE, TONY
分类号 H01L21/331;H01L21/8249;H01L29/737 主分类号 H01L21/331
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