发明名称 |
Heterojunction Bipolar Transistor |
摘要 |
A heterostructure bipolar transistor, HBT, includes shallow trench isolation, STI, structures 6 around a buried collector drift region 8 in contact with a buried collector. A gate stack 10 including a gate oxide 12 and a gate 14 is deposited and etched to define a base window 20 over the buried collector drift region 8 and overlapping the STI structures 6. The etching process is continued to selectively etch the buried collector drift region 8between the STI structures 6 to form a base well 22. SiGeC may be selectively deposited to form epitaxial silicon-germanium 26 in the base well in contact with the buried collector drift region 8 and poly silicon-germanium 28 on the side walls of the base well and base window. Spacers 32 are then formed as well as an emitter 34.
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申请公布号 |
EP2315238(A1) |
申请公布日期 |
2011.04.27 |
申请号 |
EP20090174032 |
申请日期 |
2009.10.26 |
申请人 |
NXP B.V. |
发明人 |
DONKERS, JOHANNES JOSEPHUS THEODORUS MARINUS;MERTENS, HANS;VANHOUCKE, TONY |
分类号 |
H01L21/331;H01L21/8249;H01L29/737 |
主分类号 |
H01L21/331 |
代理机构 |
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