| 摘要 |
<p>A test apparatus that tests a device under test, including (i) a master domain that includes a master period signal generating section, which generates a master period signal, where the master domain operates based on the master period signal and (ii) a slave domain that includes a slave period signal generating section, which generates a slave period signal, where the slave domain operates based on the slave period signal. The master period signal generating section receives a control signal and resumes generation of the master period signal, which is on hold, and the slave period signal generating section receives the control signal, initializes phase data of the slave period signal, and resumes generation of the slave period signal, which is on hold.</p> |
