发明名称 Composition useful to chemical mechanical planarization of metal
摘要 A chemical mechanical polishing composition, the polishing composition includes polishing abrasive, an oxidizing agent, an accelerating compound, an inhibitor, a co-inhibitor, and a solvent as the remaining. The composition can maintain a high removal rate through polishing, meantime it has a feature to inhibit static etch rate and lower the defect of polishing including metal dishing and erosion. Hence it needs no change of the composition for simultaneously removing a most part of a metal layer, particularly for a first stage of polishing bulk copper layer and for a second micro-polishing stage of removing the remaining less copper; the present invention has the advantage of simplifying processing and reducing waste.
申请公布号 US7931714(B2) 申请公布日期 2011.04.26
申请号 US20070868577 申请日期 2007.10.08
申请人 UWIZ TECHNOLOGY CO., LTD. 发明人 CHANG SONGYUAN
分类号 B24D3/02;C09C1/68;C09K3/14 主分类号 B24D3/02
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