| 摘要 |
PROBLEM TO BE SOLVED: To reduce scanning time of a buffer memory 14 in redundancy processing. SOLUTION: A memory test device includes: a determining part for determining quality of a DUT; a fail memory for storing fail data output from the determining part; a format converting part for converting a data format of the fail data stored in the fail memory; a buffer memory for storing the fail data converted by the format converting part; and a redundancy operating part for performing redundancy processing for each IO of the DUT by scanning the buffer memory for each address. The format converting part converts the data format of the fail data so that the fail data of a plurality of addresses in one IO of the DUT is stored on one address in the buffer memory, from the data format in which the fail data of one address in each IO of the DUT is stored on one address in the fail memory. COPYRIGHT: (C)2011,JPO&INPIT
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