发明名称 DEVICE AND METHOD FOR MEASURING FREQUENCY AND ELECTRONIC APPARATUS EQUIPPED WITH THE DEVICE FOR MEASURING FREQUENCY
摘要 <p><P>PROBLEM TO BE SOLVED: To reduce the effect of pattern noise in a frequency measuring device of a short-gate time counting system. <P>SOLUTION: The frequency measurement device includes a plurality of frequency measurement devices (C1-Cn) of the short-gate time count system which generate outputs, corresponding to frequencies of measuring object signals and differ in a sampling frequency; a selector (50) which selects an output of some of the frequency measuring devices in a plurality and relays it to the latter stage; and a controller (100), which determines pattern noise levels in the frequency measurement devices, based on operating point parameters of the individual frequency measurement devices and makes the selector select the frequency measurement device having lower pattern noise level. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011080948(A) 申请公布日期 2011.04.21
申请号 JP20090235148 申请日期 2009.10.09
申请人 SEIKO EPSON CORP 发明人 GOHARA MASAYOSHI
分类号 G01R23/10 主分类号 G01R23/10
代理机构 代理人
主权项
地址