发明名称 PROCESS FOR THE TRANSFER OF A THIN FILM COMPRISING AN INCLUSION CREATION STEP
摘要 A process for transferring a thin film includes forming a layer of inclusions to create traps for gaseous compounds. The inclusions can be in the form of one or more implanted regions that function as confinement layers configured to trap implanted species. Further, the inclusions can be in the form of one or more layers deposited by a chemical vapor deposition, epitaxial growth, ion sputtering, or a stressed region or layer formed by any of the aforementioned processes. The inclusions can also be a region formed by heat treatment of an initial support or by heat treatment of a layer formed by any of the aforementioned processes, or by etching cavities in a layer. In a subsequent step, gaseous compounds are introduced into the layer of inclusions to form micro-cavities that form a fracture plane along which the thin film can be separated from a remainder of the substrate.
申请公布号 US2011092051(A1) 申请公布日期 2011.04.21
申请号 US20100977757 申请日期 2010.12.23
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 MORICEAU HUBERT;BRUEL MICHEL;ASPAR BERNARD;MALEVILLE CHRISTOPHE
分类号 H01L21/302;H01L21/02;H01L21/265;H01L21/306;H01L21/31;H01L21/762;H01L27/12 主分类号 H01L21/302
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