发明名称 Strained Semiconductor Using Elastic Edge Relaxation, a Buried Stressor Layer and a Sacrificial Stressor Layer
摘要 The present invention relates to creating an active layer of strained semiconductor using a combination of buried and sacrificial stressors. That is, a process can strain an active semiconductor layer by transferring strain from a stressor layer buried below the active semiconductor layer and by transferring strain from a sacrificial stressor layer formed above the active semiconductor layer. As an example, the substrate may be silicon, the buried stressor layer may be silicon germanium, the active semiconductor layer may be silicon and the sacrificial stressor layer may be silicon germanium. Elastic edge relaxation is preferably used to efficiently transfer strain to the active layer.
申请公布号 US2011092047(A1) 申请公布日期 2011.04.21
申请号 US20100687646 申请日期 2010.01.14
申请人 ACORN TECHNOLOGIES, INC. 发明人 GAINES R. STOCKTON;CONNELLY DANIEL J.;CLIFTON PAUL A.
分类号 H01L21/762 主分类号 H01L21/762
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