发明名称 |
FORMING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for manufacturing a semiconductor device includes steps: providing a substrate (101); forming a source area and a drain area on the substrate, a dummy gate structure on the substrate located between the source area and the drain area, and a gate dielectric layer forming between the substrate and the dummy gate structure (102); annealing the source area and the drain area (103); removing the dummy gate structure to form an opening (104); planting ions from the opening to the substrate to form a steep retrograde dopant well (105); laser annealing to the opening to activate the dopant (106); and depositing to form a metal gate on the gate dielectric layer (107).</p> |
申请公布号 |
WO2011044776(A1) |
申请公布日期 |
2011.04.21 |
申请号 |
WO2010CN74205 |
申请日期 |
2010.06.22 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHU, HUILONG;WANG, WENWU |
发明人 |
ZHU, HUILONG;WANG, WENWU |
分类号 |
H01L21/8232;H01L29/772 |
主分类号 |
H01L21/8232 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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