发明名称 FORMING METHOD FOR SEMICONDUCTOR DEVICE
摘要 <p>A method for manufacturing a semiconductor device includes steps: providing a substrate (101); forming a source area and a drain area on the substrate, a dummy gate structure on the substrate located between the source area and the drain area, and a gate dielectric layer forming between the substrate and the dummy gate structure (102); annealing the source area and the drain area (103); removing the dummy gate structure to form an opening (104); planting ions from the opening to the substrate to form a steep retrograde dopant well (105); laser annealing to the opening to activate the dopant (106); and depositing to form a metal gate on the gate dielectric layer (107).</p>
申请公布号 WO2011044776(A1) 申请公布日期 2011.04.21
申请号 WO2010CN74205 申请日期 2010.06.22
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHU, HUILONG;WANG, WENWU 发明人 ZHU, HUILONG;WANG, WENWU
分类号 H01L21/8232;H01L29/772 主分类号 H01L21/8232
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