发明名称 Verfahren zum Herstellen einer Schutzstruktur
摘要 A protective structure is produced by providing a semiconductor substrate having doping of a first conductivity type. A semiconductor layer having doping of a second conductivity type is applied at a surface of the semiconductor substrate. A buried layer with doping of a second conductivity type is formed in a first region of the semiconductor layer, producing a layer at the junction between the semiconductor layer and semiconductor substrate. A first dopant zone having doping of a first conductivity type is formed in the first region of the semiconductor layer above the buried layer. A second dopant zone having doping of a second conductivity type is formed in a second region of the semiconductor layer. An electrical insulation is formed between the first and second regions of the semiconductor layer. A common connection device is formed for the first and second dopant zones.
申请公布号 DE102007024355(B4) 申请公布日期 2011.04.21
申请号 DE20071024355 申请日期 2007.05.24
申请人 INFINEON TECHNOLOGIES AG 发明人 AHRENS, CARSTEN;SCHMENN, ANDRE;SOJKA, DAMIAN
分类号 H01L23/60;H01L21/74;H01L29/868 主分类号 H01L23/60
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