发明名称 PARTICLE IMAGE ANALYSIS METHOD AND APPARATUS
摘要 A particle image analyzing method is adapted so that while raising image-reviewing efficiency at a cropped image level of particle components in a sample, the entire sample can be observed without significantly changing a related apparatus configuration. Prior to image reviewing of an imaging region, cropped images thereof are reviewed and, with reference to the images arranged for each kind of particle component, if the operator judges any particles to have been falsely identified, the operator uses an operating unit to modify positions of the particles to those of correct component items. An overall image of the imaging region is displayed and if any components to be added (overlooked components) appear, the kinds of these components are identified and quantitative data on each kind of component is registered. Upon completion of the registration, the concentration of the sample is recalculated and a comment is entered in a comment field.
申请公布号 US2011090247(A1) 申请公布日期 2011.04.21
申请号 US20090996114 申请日期 2009.05.12
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 TAKI MIKI;OOWADA NORIO
分类号 G06K9/46;G06K9/00;G09G5/00 主分类号 G06K9/46
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