METHOD FOR MANUFACTURING TRANSISTOR EVALUATION DEVICE, AND TRANSISTOR EVALUATION DEVICE

摘要

A method for manufacturing a transistor evaluation device is provided with: a step for preparing a mother board (300) including a first circuit formation region (301A) in which a first matrix circuit for liquid crystal display can be formed and a second circuit formation region (301B) in which a second matrix circuit for liquid crystal display can be formed, the second circuit formation region having a yield lower than that of the first circuit formation region (301A); a step for forming the first matrix circuit in the first circuit formation region (301A); a step for forming a transistor evaluation circuit in the second circuit formation region (301B); and a step for cutting out the transistor evaluation circuit by cutting the mother board (300).