发明名称
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method for a semiconductor device, capable of easily and accurately removing burrs formed when resin sealing, in a short time. <P>SOLUTION: The manufacturing method for the semiconductor device has a resin-sealing process S5 for selecting a used molding die from a plurality of the molding dies, and sealing a die pad and a semiconductor element; and a marking process S6 for marking a discriminating symbol, capable of discriminating the molding die on a lead frame. The manufacturing method, further, has a discriminating process S7 for reading the discriminating symbol, and discriminating the used molding die, while reading the positional information of a corresponding burrs from a recording medium recording the positional information at each molding die; and a deburring process S8 for irradiating a specified place with a laser, and removing the burr formed on the lead frame, on the basis of the positional information of the burr. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP4674813(B2) 申请公布日期 2011.04.20
申请号 JP20060030644 申请日期 2006.02.08
申请人 发明人
分类号 H01L21/56;H01L23/50 主分类号 H01L21/56
代理机构 代理人
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