| 摘要 |
PURPOSE: A mother substrate test device and a test method thereof are provided to implement a mother substrate test for any numbers of panels. CONSTITUTION: A signal supply part(100) generates a plurality of signal groups and a plurality of dummy signals for inspecting a plurality of panels that are formed in a mother substrate(300). A connecting board(200) transfers one of the signal groups to corresponding one of the panels and, if the number of the panels is greater than the number of the signal groups, transfers signals of one signal group to at least two of the panels.
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