发明名称 SEMICONDUCTOR CONSTRUCTIONS, METHODS OF FORMING CAPACITORS, AND METHODS OF FORMING DRAM ARRAYS
摘要 Some embodiments include methods of forming capacitors. A first section of a capacitor may be formed to include a first storage node, a first dielectric material, and a first plate material. A second section of the capacitor may be formed to include a second storage node, a second dielectric material, and a second plate material. The first and second sections may be formed over a memory array region, and the first and second plate materials may be electrically connected to first and second interconnects, respectively, that extend to over a region peripheral to the memory array region. The first and second interconnects may be electrically connected to one another to couple the first and second plate materials to one another. Some embodiments include capacitor structures, and some embodiments include methods of forming DRAM arrays.
申请公布号 EP2215658(A4) 申请公布日期 2011.04.20
申请号 EP20080854463 申请日期 2008.10.16
申请人 MICRON TECHNOLOGY, INC. 发明人 PLUM, TODD, JACKSON
分类号 H01L27/108;H01L21/02;H01L21/8242;H01L27/06 主分类号 H01L27/108
代理机构 代理人
主权项
地址