发明名称 Dual stress STI
摘要 The embodiments of the invention provide a device, method, etc. for a dual stress STI. A semiconductor device is provided having a substrate with a first transistor region and a second transistor region different than the first transistor region. The first transistor region comprises a PFET; and, the second transistor region comprises an NFET. Further, STI regions are provided in the substrate adjacent sides of and positioned between the first transistor region and the second transistor region, wherein the STI regions each comprise a compressive region, a compressive liner, a tensile region, and a tensile liner.
申请公布号 US7927968(B2) 申请公布日期 2011.04.19
申请号 US20080125106 申请日期 2008.05.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KIM DEOK-KEE;KIM SEONG-DONG;KWON OH-JUNG
分类号 H01L21/76 主分类号 H01L21/76
代理机构 代理人
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