发明名称 Apparatus and method for testing and debugging an integrated circuit
摘要 A system for receiving serial messages from a device under test includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.
申请公布号 US7930604(B1) 申请公布日期 2011.04.19
申请号 US20100778225 申请日期 2010.05.12
申请人 MARVELL INTERNATIONAL LTD. 发明人 AZIMI SAEED;HO SON;SMATHERS DANIEL
分类号 G01R31/28 主分类号 G01R31/28
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