发明名称 Cleaning of photolithography masks
摘要 A method and an equipment for cleaning masks used for photolithography steps, including at least one step of thermal treatment under pumping at a pressure lower than the atmospheric pressure and at a temperature greater than the ambient temperature.
申请公布号 US7927969(B2) 申请公布日期 2011.04.19
申请号 US20070715125 申请日期 2007.03.07
申请人 STMICROELECTRONICS S.A. 发明人 MARTIN CHRISTOPHE
分类号 H01L21/331;G03F1/00;H01L21/425;H01L21/76 主分类号 H01L21/331
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