| 发明名称 |
Enabling memory redundancy during testing |
| 摘要 |
A design structure embodied in a machine readable medium for designing, manufacturing, testing and/or enabling a redundant memory element (20) during testing of a memory array (14), and a method of repairing a memory array.
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| 申请公布号 |
US7930592(B2) |
申请公布日期 |
2011.04.19 |
| 申请号 |
US20070829187 |
申请日期 |
2007.07.27 |
| 申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
OUELLETTE MICHAEL RICHARD;ROWLAND JEREMY |
| 分类号 |
G06F11/00;G11C29/00;G11C29/14;G11C29/24;G11C29/44 |
主分类号 |
G06F11/00 |
| 代理机构 |
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