发明名称 Method for classifying microelectronic dies using die level cherry picking system based on dissimilarity matrix
摘要 A computer implemented method for ordering a plurality of entities by computing a dissimilarity matrix based on a plurality of probabilities. The pluralities of probabilities are determined based on a plurality of classes. A weighted distance matrix is computed based the dissimilarity matrix. A plurality of rank ordered sequence candidates based at least in part on the sum of weighted distances between neighboring entities in the rank ordered sequence is calculated. Other embodiments are described in the claims.
申请公布号 US7930266(B2) 申请公布日期 2011.04.19
申请号 US20060372610 申请日期 2006.03.09
申请人 INTEL CORPORATION 发明人 TUV EUGENE;SHAHAPURKAR SOMNATH;BORISOV ALEXANDER
分类号 G06F17/10 主分类号 G06F17/10
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