发明名称 Apparatus and Method for Through Silicon via Impedance Matching
摘要 Methods and apparatuses for matching impedances in a flip-chip circuit assembly are presented. An apparatus for matching impedances in a flip-chip circuit assembly may include a first circuit associated with a first die and a through silicon via (TSV) coupling the first circuit to a second circuit. The apparatus may further include a first impedance matching inductor interposed between the TSV and the second circuit. A method for matching impedances in a flip-chip circuit assembly may include providing a die having a first circuit, and forming a TSV over the die. The method may further include providing a second circuit and forming a first impedance matching inductor interposed between the TSV and second circuit.
申请公布号 US2011084358(A1) 申请公布日期 2011.04.14
申请号 US20090576094 申请日期 2009.10.08
申请人 QUALCOMM INCORPORATED 发明人 KIM JONGHAE;YANG JEONG HWAN;NOWAK MATTHEW M.
分类号 H01L29/66;H01L21/02;H01L21/768;H03H7/38 主分类号 H01L29/66
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