发明名称 |
EPITAXIAL WAFER AND PRODUCTION METHOD THEREOF |
摘要 |
<p>PURPOSE: An epitaxial wafer and manufacturing method thereof are provided to prevent the defects of an epitaxial layer due to a bubble type void aggregate by controlling the number of bubble type void aggregates. CONSTITUTION: A silicon crystal is grown up by adding hydrogen and nitrogen to silicon-melt solutions. A silicon substrate is prepared by mechanically processing the silicon crystal. An epitaxial layer is formed on the surface of the silicon substrate. A single silicon crystal is grown under the partial hydrogen pressure between 0.1 mbar and 0.4 mbar.</p> |
申请公布号 |
KR20110038581(A) |
申请公布日期 |
2011.04.14 |
申请号 |
KR20100092938 |
申请日期 |
2010.09.24 |
申请人 |
SILTRONIC AG |
发明人 |
NAKAI KATSUHIKO;MUELLER TIMO;IKARI ATSUSHI;AMMON WILFRIED VON;WEBER MARTIN |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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