发明名称 EPITAXIAL WAFER AND PRODUCTION METHOD THEREOF
摘要 <p>PURPOSE: An epitaxial wafer and manufacturing method thereof are provided to prevent the defects of an epitaxial layer due to a bubble type void aggregate by controlling the number of bubble type void aggregates. CONSTITUTION: A silicon crystal is grown up by adding hydrogen and nitrogen to silicon-melt solutions. A silicon substrate is prepared by mechanically processing the silicon crystal. An epitaxial layer is formed on the surface of the silicon substrate. A single silicon crystal is grown under the partial hydrogen pressure between 0.1 mbar and 0.4 mbar.</p>
申请公布号 KR20110038581(A) 申请公布日期 2011.04.14
申请号 KR20100092938 申请日期 2010.09.24
申请人 SILTRONIC AG 发明人 NAKAI KATSUHIKO;MUELLER TIMO;IKARI ATSUSHI;AMMON WILFRIED VON;WEBER MARTIN
分类号 H01L21/20 主分类号 H01L21/20
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