发明名称 PATTERN SHAPE EVALUATING DEVICE USING SCANNING CHARGED PARTICLE MICROSCOPE, AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To solve such the problem that since a tilt image includes various contours of a three-dimensional pattern and also includes an edge due to a shape change out of measured objects because of roughness of a pattern surface etc., shape recognition is too complicated to easily perform shape measurement through image processing, and it is difficult to determine an observation direction suitable for shape evaluation of the pattern. SOLUTION: The predicted position (predicted contour) of the contour of a pattern on a captured image is estimated from the imaging direction of the pattern to be evaluated and design data of a circuit pattern included in an imaging region, the predicted range of a positional shift of the predicted contour from an actual contour is set, and an image processing range or image processing method is set on the basis of the predicted range of the positional shift to calculate the size, contour, image featured value, and three-dimensional shape of the pattern. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011077299(A) 申请公布日期 2011.04.14
申请号 JP20090227238 申请日期 2009.09.30
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 MIYAMOTO ATSUSHI;SHISHIDO CHIE;KAMITAKI TAKESHI;MATSUOKA RYOICHI
分类号 H01L21/66;G01N23/225;H01J37/22;H01J37/28 主分类号 H01L21/66
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