发明名称 METHOD FOR FORMING SILICIDE AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for forming silicide wherein silicide can be formed at lower temperatures without increasing the wet cleaning process. SOLUTION: In the method for forming silicide on a substrate 101 having a surface where silicon and silicon oxide are exposed, the temperature of the substrate 101 is set to be 400°C or more, and a manganese organic compound gas is supplied onto the surface of the substrate 101 where silicon and silicon oxide are exposed, and the silicon exposed to the surface of the substrate 101 is selectively manganese-silicified. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011077110(A) 申请公布日期 2011.04.14
申请号 JP20090224358 申请日期 2009.09.29
申请人 TOKYO ELECTRON LTD 发明人 MATSUMOTO KENJI;ITO HITOSHI;SATO HIROSHI
分类号 H01L21/28;C01B33/06;H01L21/285;H01L21/336;H01L29/417;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/28
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