发明名称 SPECIMEN INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a specimen inspection apparatus allowing a user to inspect with setting data for which optimum values have been set by an operator in charge of maintenance, and capable of inspecting the setting data altered by the user as effective setting data as for the setting data related to an information output. SOLUTION: When identification information accepted through input is the identification information corresponding to a first right of use to be given to the operator in charge of maintenance, an input of the setting data controlling operations of a measurement mechanism and the setting data related to the information output is accepted. When the identification information allowed to be input is the identification information corresponding to a second authorization to be given to an operator in charge of specimen inspection, only the input of the setting data related to the information output is accepted. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011075468(A) 申请公布日期 2011.04.14
申请号 JP20090229030 申请日期 2009.09.30
申请人 SYSMEX CORP 发明人 HAMADA YUICHI;SHIBATA MASAHARU;FUKUMA DAIGO
分类号 G01N35/00 主分类号 G01N35/00
代理机构 代理人
主权项
地址