发明名称 Method of fabricating an organic thin film transistor and method of surface treatment for gate insulating layer
摘要 A method of fabricating an organic thin film transistor is disclosed, which comprises steps of (S1) forming a gate electrode on a substrate; (S2) forming a gate insulating layer on the gate electrode; (S3) providing a gas on the surface of the gate insulating layer to form hydrophobic molecules on the surface of the gate insulating layer; (S4) forming an organic semiconductor layer, a source electrode, and a drain electrode over the gate insulating layer having hydrophobic molecules thereon, wherein the gas of step (S3) is at least one selected from the group consisting of halogen-substituted hydrocarbon, un-substituted hydrocarbon, and the mixtures thereof. The method of the present invention utilizes gases comprising carbon or fluorine atom to perform surface treatment on the surface of the gate insulating layer, therefore the hydrophobic character of the surface of the gate insulating layer can be enhanced and the electrical properties of the OTFT can be improved. Also, a method of surface treatment for the gate insulating layer is disclosed.
申请公布号 US2011086467(A1) 申请公布日期 2011.04.14
申请号 US20100656331 申请日期 2010.01.26
申请人 NATIONAL TSING HUA UNIVERSITY 发明人 CHOU CHENG WEI;ZAN HSIANO WEN;HWANG JENN-CHANG;WANG CHUNG HWA;TSAI LI SHIUAN;WANG WEN CHIEH
分类号 H01L51/40 主分类号 H01L51/40
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