发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device with an electrode having low contact resistance to a nitride semiconductor. SOLUTION: The method of manufacturing the semiconductor device includes a carbon-containing layer forming process S4 of forming a carbon-containing layer which contains carbon on the nitride semiconductor layer and a titanium-containing layer forming process S6 of forming a titanium-containing layer containing titanium on the carbon-containing layer. A layer of an all proportional solid solution Ti (C, N) of TiN and TiC is formed between the titanium-containing layer and the nitride semiconductor layer. Consequently, the titanium-containing layer is ohmic-connected to the nitride semiconductor layer at the whole boundary thereof. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011077428(A) 申请公布日期 2011.04.14
申请号 JP20090229381 申请日期 2009.10.01
申请人 TOYOTA MOTOR CORP;OSAKA UNIV 发明人 SUGIMOTO MASAHIRO;SEKI AKINORI;KAWAHASHI KEN;TAKAHASHI YASUO;MAEDA MASAKATSU
分类号 H01L21/28;H01L21/338;H01L29/43;H01L29/812 主分类号 H01L21/28
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