| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To reduce load of a device under test at the time of probe. <P>SOLUTION: The signal acquisition system includes a signal acquisition probe having a probe tip circuit 202 coupled to a resistive center conductor signal cable 206, and a signal is coupled to a signal processing instrument via an input node 216. The input node 216 is coupled to an input current amplification circuit 230 via an input circuit 222. The input circuit 222 provides the resistive center conductor signal cable 206 with at least one of resistive termination and capacitive termination. The termination of the resistive center conductor signal cable 206 in the signal processing instrument is provided to the signal acquisition system, where the capacitive load of a device under test at higher frequencies is reduced by reducing the input capacitance of the probe tip circuit resulting in an increase in signal acquisition frequency bandwidth. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
