| 摘要 |
A test apparatus testing a device under test includes a main pattern generating section that generates a main pattern, a plurality of sub-pattern generating sections each of which generates a sub-pattern corresponding to a different one of segment cycles based on a main pattern, the segment cycles formed by dividing a test cycle period, a test signal supplying section that supplies, to the device under test, a multiplexed test pattern formed by switching sub-patterns generated by the plurality of sub-pattern generating sections at each of the segment cycles, and a plurality of delay selecting sections each of which selects one of a main pattern that is from the main pattern generating section and a delayed main pattern that is formed by delaying the main pattern from the main pattern generating section by a test cycle, to supply the selected one to the corresponding sub-pattern generating section.
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