发明名称 Graphical analysis to detect process object anomalies
摘要 A method and system for graphical analysis to detect anomalies in process objects. The method generates a graph to represent a set of process objects, applies a clustering algorithm to cluster like nodes of the graph, compares the clusters to the process objects, and, if the objects match the clusters, accepts the objects for further review or for use in applications. If one or more of the objects do not match the clusters, such suggests that there are anomalies in the process objects requiring correction. An example implementation may be to detect anomalies in the design of the process objects.
申请公布号 US7926026(B2) 申请公布日期 2011.04.12
申请号 US20060613413 申请日期 2006.12.20
申请人 SAP AG 发明人 KLEIN UDO;WIECZOREK THOMAS;ZIMMERMANN DANIEL;SIEVI OLIVER;PECHT-SEIBERT GUENTER
分类号 G06F9/44 主分类号 G06F9/44
代理机构 代理人
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