Implementing enhanced array access time tracking with logic built in self test of dynamic memory and random logic

摘要

A method and circuit for implementing substantially perfect array access time tracking with Logic Built In Self Test (LBIST) diagnostics of dynamic memory array and random logic, and a design structure on which the subject circuit resides are provided. The dynamic memory array is initialized to a state for the longest read time for each bit and the dynamic memory array is forced into a read only mode. During LBIST diagnostics with the array in the read only mode, the array outputs are combined with the data inputs to provide random switching data on the array outputs to the random logic.