发明名称 Coating/developing apparatus and pattern forming method
摘要 A coating/developing apparatus includes a process section including processing units to perform a series of processes for resist coating and development; an interface section disposed between the process section and immersion light exposure apparatus; and a drying section disposed in the interface section to dry the substrate immediately after the immersion light exposure process. The drying section includes a process container configured to accommodate the substrate, a substrate support member configured to place the substrate thereon, a temperature-adjusted gas supply mechanism configured to supply a temperature-adjusted gas into the process container, and an exhaust mechanism configured to exhaust the process container. The drying section is arranged to dry the substrate by supplying the temperature-adjusted gas into the process container with the substrate placed on the substrate support member, while exhausting the process container.
申请公布号 US7924396(B2) 申请公布日期 2011.04.12
申请号 US20070958798 申请日期 2007.12.18
申请人 TOKYO ELECTRON LIMITED 发明人 KAWANO HISASHI;KITANO JUNICHI;KOSUGI HITOSHI;HONTAKE KOICHI;ENOMOTO MASASHI
分类号 G03B27/32;F26B5/04;F26B9/06;F26B21/10;G03B5/00;H01L21/027 主分类号 G03B27/32
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