发明名称 Through-via and method of forming
摘要 In one embodiment, a method of forming a via includes forming an first opening in the semiconductor substrate, wherein the first opening has a bottom and sidewalls, forming a sacrificial fill in the first opening, forming a dielectric layer over the sacrificial fill, forming a second opening in the dielectric layer, wherein the second opening is over the sacrificial fill, removing the sacrificial fill from the first opening after forming the second opening, and forming a conductive material in the first opening and second opening.
申请公布号 US7923369(B2) 申请公布日期 2011.04.12
申请号 US20080277458 申请日期 2008.11.25
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 SMITH BRADLEY P.
分类号 H01L21/44 主分类号 H01L21/44
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