| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a good quality light-emitting device by inspecting and repairing a defective part of a light-emitting element having an anode, a cathode, and an organic compound layer. <P>SOLUTION: A defective part is detected by impressing a bias voltage on the light-emitting element having the defective part. Such defective part can be measured by an emission microscope. Laser beams are irradiated on the detected defective part, and a short circuit portion of the defective part is physically separated to repair it. After irradiating laser beams, an insulating film can be formed in the defective part. The light-emitting device is manufactured by this method. <P>COPYRIGHT: (C)2011,JPO&INPIT |
