发明名称 Silicon wafer holes coating method for microlithography application, involves bringing particles with center diameter into prepared holes of substrate, and melting particles brought into prepared holes
摘要 <p>The method involves bringing particles with a center diameter into prepared holes (3), where the center diameter of the particles is smaller than maximum diameter (9) of the holes. The particles brought into the prepared holes are melted. The particles are applied on a substrate surface. The holes are provided with an aspect ratio, which results from depth (7) of the holes and the maximum hole diameter that is larger than 6, where the maximum hole diameter is smaller than 200 micrometer. A laser radiation is irradiated by the holes facing a side of a substrate (1) i.e. silicon wafer. An independent claim is also included for a coating device for filling a prepared hole in a substrate.</p>
申请公布号 DE102009029374(A1) 申请公布日期 2011.04.07
申请号 DE20091029374 申请日期 2009.09.11
申请人 CARL ZEISS SMT GMBH 发明人 PAZIDIS, ALEXANDRA;GOEHNERMEIER, AKSEL
分类号 H01L21/768;H01L21/268;H01L21/321 主分类号 H01L21/768
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