发明名称 AUTOMATED SPECIMEN TESTING SYSTEM
摘要 <p>When specimen racks in a loop are used many times in a system in order to prevent an increase in size and complication of a device, the processing speed often decreases due to intersection of conveying lines. In order to prevent such intersection, a complicated mechanism such as an elevating mechanism or a robot hand mechanism is required. To avoid this, empty rack conveying lines are independently disposed at lower positions of a main conveying line, an emergency passing line, and a return line, and are connected to inclined conveying lines in a rack stocker between a storing module and a charging module. With this, the conveying lines can be prevented from intersecting with each other, and empty racks can be continuously supplied and collected. As a result, the conveying lines can be prevented from intersecting with each other using a simple structure without an increase in size or complication of the device, and the empty racks can be continuously supplied and collected without a reduction in processing capacity. In addition, an automated specimen testing system that is highly expandable in accordance with the scale of facilities can be provided.</p>
申请公布号 WO2011040197(A1) 申请公布日期 2011.04.07
申请号 WO2010JP65435 申请日期 2010.09.08
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION;FUKUGAKI TATSUYA;HANAWA MASAAKI;OHGA HIROSHI 发明人 FUKUGAKI TATSUYA;HANAWA MASAAKI;OHGA HIROSHI
分类号 G01N35/04 主分类号 G01N35/04
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