发明名称 METHOD OF PROCESSING WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method of processing a wafer, wherein the method reduces chipping occurring to an annular projection and efficiently discharges a processing liquid, such as an etchant and a resist liquid, to the outside of the wafer. SOLUTION: The method of processing the wafer having, on a top surface, a device region where a plurality of devices are formed and an outer peripheral surplus region surrounding the device region includes: a wafer grinding step of grinding a region corresponding to the device region of the wafer to form a circular recess on a back surface, and also forming the annular projection surrounding the circular recess; and an annular projection cutting step of rotating a holding means holding the wafer while rotating a cutting blade having an axis of rotation parallel with a holding surface, moving the holding means and grinding blade relatively to cut the annular projection, and thereby forming a slope which is inclined from an upper surface inner peripheral side of the annular projection toward the wafer center of the circular recess. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011071289(A) 申请公布日期 2011.04.07
申请号 JP20090220706 申请日期 2009.09.25
申请人 DISCO ABRASIVE SYST LTD 发明人 RIKIISHI TOSHIYASU
分类号 H01L21/304;B24B1/00 主分类号 H01L21/304
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