发明名称 IMPLEMENT FOR CIRCUIT INSPECTION
摘要 PROBLEM TO BE SOLVED: To mount a connecting part for short-circuiting between terminals, quickly and without damaging, so as to solve the problem that unrepairable damage is often given to a substrate in working such as soldering by handwork which is needed for temporarily short-circuiting part of the terminals of a product operating normally in regard to an existing implement which is used for a method of testing a boundary scan test wherein input and output of a test signal are measured by using a terminal (TAP: Test Access Port) for debugging of an integrated circuit in order to check the operation of the integrated circuit. SOLUTION: The implement for circuit inspection includes a conductive member and a supporting member supporting the conductive member, and the supporting member has a surface for fixing the conductive member so that this member may come into contact with two adjacent terminals of the integrated circuit having the terminals in a plurality. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011069723(A) 申请公布日期 2011.04.07
申请号 JP20090221071 申请日期 2009.09.25
申请人 CLARION CO LTD 发明人 MASAYA AKITA;AOKI AKITO
分类号 G01R31/00;G01R31/02 主分类号 G01R31/00
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