发明名称 IMPROVED POST-TEXTURING CLEANING METHOD FOR PHOTOVOLTAIC SILICON SUBSTRATES
摘要 An improved method for post-texturing cleaning, surface conditioning, and rinsing silicon wafers or similar surfaces, with particular, although not exclusive, applicability in photovoltaic applications which includes cleaning the surfaces sequentially with dilute HF/HCI and dilute oxidizing rinse, particularly following texturing with concentrated HF/HNO3 and/or KOH. The method allows for the recycling of the oxidizing rinse in t dilute HF/HCI and other upstream rinse steps.
申请公布号 WO2011040966(A2) 申请公布日期 2011.04.07
申请号 WO2010US02651 申请日期 2010.09.30
申请人 MT SYSTEMS, INC.;REINHARDT, KAREN, A.;HERRERA, PYTHIAS, V.;VUKOSAV, THOMAS, M. 发明人 REINHARDT, KAREN, A.;HERRERA, PYTHIAS, V.;VUKOSAV, THOMAS, M.
分类号 B08B3/00 主分类号 B08B3/00
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