METHOD FOR ACCESSING TWO OR MORE TAPS THROUGH SINGLE TAP (TEST ACCESS PORT), AND INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide an integrated circuit which accesses a plurality of TAPs (Test Access Ports) through a single TAP.

SOLUTION: The first duplicated state machine (26) and the second duplicated state machine (28) are respectively used to separately test the first state machine (20) and the second state machine (22) without correcting both of these two state machines (20)/(22). This invention can integrate controlling and testing of various reusable parts of IC or modules designed so as to originally be used in separate IC.

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