发明名称 OUTPUT CONTROL SCAN FLIP-FLOP, SCAN TEST CIRCUIT WITH THE USE OF THE SAME, AND TEST DESIGNING METHOD
摘要 PROBLEM TO BE SOLVED: To obviate the need of a delay test controller or a plurality of DELAY TEST MODE signal lines to reduce a size of a circuit. SOLUTION: An output control scan flip-flop 1 can control holding and inverting of an output value irrespective of an input value. The output control scan flip-flop 1 includes a scan flip-flop 3, a memory device 2 that operates in synchronization with a clock signal and stores first input data input from an external device, a non-exclusive logical sum circuit 4 for inputting an output signal of the memory device 2 and an output signal of the scan flip-flop 3, and a selector 5 that inputs a second input data input from an external device, an output signal of the non-exclusive logical sum circuit 4 and a select signal from an external device, and outputs an output signal to be input to the scan flip-flop 3. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011069768(A) 申请公布日期 2011.04.07
申请号 JP20090222296 申请日期 2009.09.28
申请人 RENESAS ELECTRONICS CORP 发明人 SHIKAMATA MIKIHIRO
分类号 G01R31/28;H01L21/822;H01L27/04 主分类号 G01R31/28
代理机构 代理人
主权项
地址