| 摘要 |
PROBLEM TO BE SOLVED: To provide a defect detector and a defect detection method having improved accuracy in detecting defects in a formed part. SOLUTION: The defect detector A comprises: an imaging means 1 for imaging a prescribed inspection region of an object to be inspected B constituted of a formed part and a metal part; an image processing part 2 for computing the mode value of gray values of pixels for every prescribed line on a partial image corresponding to the metal part in an inspection image acquired by imaging by the imaging means 1, setting a threshold value for every line on the basis of each computed mode value, extracting a defect candidate pixel for every line by binarization on the basis of set threshold values, setting a defect candidate part by labeling extracted defect candidate pixels, and computing an average gray value of a set defect candidate part; a storage part 3 for storing a defect threshold value for determining whether the defect candidate part is a defect or not; and a defect determination part 4 for determining whether the defect candidate part is a defect or not by comparing the level of the average gray value of the defect candidate part with that of the defect threshold value. COPYRIGHT: (C)2011,JPO&INPIT |
